Thurs, Sept 15th, 3:25 PM
Talk: Assembly, characterization and applications of chirality-sorted carbon nanotube devices
Thurs, Sept 15th, 3:25 PM Talk: Voltage-contrast Scanning Electron Microscopy for the electronic characterization of carbon nanotube devices Thurs, Sept 1st, 2:40 PM. Talk: Assembly, characterization and applications of single-chirality carbon nanotube devices CT28, Wed, July 13th, 11:30 AM Talk: Large-scale, Bottom-up, CMOS-compatible Integration of Chirality-sorted Carbon Nanotubes. B2.7/Y2.7, Mon. Nov 29th, 4:30 - 4:45 PM Talk:Voltage-contrast Scanning Electron Microscopy as a New Technique for Statistical Analysis of Metallic and Semiconducting SWNT Devices and Location and Characterization of Defects. B4.3, Tues. Nov 30th, 2:00 - 2:15 PM Talk: Assembly and Applications of Single-Chirality Carbon Nanotube Device Arrays Saturday, Sept 4th, 11:40 - 12:00 Talk: Voltage-contrast scanning electron microscopy as a new technique for statistical analysis of SWNT devices and location and characterization of defects. MSIN satellite session, Sunday, June 27th, 14:40 - 15:00 Poster: Large-scale CMOS compatible integration of chirality sorted carbon nanotubes Session 4, Thursday, July 1st, 10:00 - 11:30 Talk: Large-scale Assembly of Single-chirality Carbon Nanotube and Graphene devices. R11.2, Thur. April 8th, 8:30 - 8:45 AM Poster: Characterization of Electronic Properties and Defects in Carbon Nanotubes by Voltage-Contrast Scanning Electron Microscopy R10.20, Wed. April 7th, 8:00 - 10:00 PM Talk: Large-Scale Directed Assembly and Rapid Characterization of Carbon Nanotube and Graphene Devices. L5.9, Tue., Dec. 1st, 4.30 - 4:45 PM Talk: High-density Arrays of Carbon Nanotube and Graphene Devices: Directed Assembly and Rapid Characterization. CT20, Wednesday 24th June, 11:30 - 11:50 |
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January 2019
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